Refractive Index Measurement using Self-interference Incoherent Digital Holography

Youngrok Kim, Sungwoong Park, Hee Jin Choi, Sung Wook Min

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

A Novel method of refractive index evaluation using self-interference incoherent digital holography is proposed. Self-interference digital holography is a powerful phase detecting solution that can record not only the intensity of the image but also phase information under incoherent lighting conditions like LEDs. The proposed system using structured patterns and an autofocus algorithm to evaluate the numerically reconstructed hologram image to find a focused depth plane. The focused depth plane indicates the optical path difference between air and refractive media. To demonstrate a proposal, the experiment is conducted by measuring the refractive index of acryl.

Original languageEnglish
Title of host publication2022 IEEE International Conference on Consumer Electronics, ICCE 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665441544
DOIs
Publication statusPublished - 2022
Event2022 IEEE International Conference on Consumer Electronics, ICCE 2022 - Virtual, Online, United States
Duration: 7 Jan 20229 Jan 2022

Publication series

NameDigest of Technical Papers - IEEE International Conference on Consumer Electronics
Volume2022-January
ISSN (Print)0747-668X

Conference

Conference2022 IEEE International Conference on Consumer Electronics, ICCE 2022
Country/TerritoryUnited States
CityVirtual, Online
Period7/01/229/01/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Keywords

  • Refractive index measurement
  • phase information
  • self-interference digital holography

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