Self-heating effect of low-temperature polycrystalline silicon thin film transistor considering grain boundary protrusion

Abu Bakar Siddik; Md Hasnat Rabbi; Sangyeon Bae; Mohammad Masum Billah; Jin Jang

Self-heating effect of low-temperature polycrystalline silicon thin film transistor considering grain boundary protrusion

Abu Bakar Siddik, Md Hasnat Rabbi, Sangyeon Bae, Mohammad Masum Billah, Jin Jang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A proper estimation of the self-heating effect is crucial to ensure the reliable performance of high mobility transistors. We perform Silvaco TCAD based thermal distribution modeling in grain, grain boundary (GB) and protrusion of excimer laser annealed (ELA) low-temperature polycrystalline (LTPS) silicon thin-film transistors (TFTs).

Original language	English
Title of host publication	26th International Display Workshops, IDW 2019
Publisher	International Display Workshops
Pages	581-583
Number of pages	3
ISBN (Electronic)	9781713806301
Publication status	Published - 2019
Event	26th International Display Workshops, IDW 2019 - Sapporo, Japan Duration: 27 Nov 2019 → 29 Nov 2019

Publication series

Name	Proceedings of the International Display Workshops
Volume	2
ISSN (Print)	1883-2490

Conference

Conference	26th International Display Workshops, IDW 2019
Country/Territory	Japan
City	Sapporo
Period	27/11/19 → 29/11/19

Bibliographical note

Publisher Copyright:
© 2019 ITE and SID.

Keywords

Grain boundary protrusion
LTPS TFT
Self-heating
Technology computer-aided design (TCAD)

Cite this

@inproceedings{6dead869523a43c69ed819665928dd6a,

title = "Self-heating effect of low-temperature polycrystalline silicon thin film transistor considering grain boundary protrusion",

abstract = "A proper estimation of the self-heating effect is crucial to ensure the reliable performance of high mobility transistors. We perform Silvaco TCAD based thermal distribution modeling in grain, grain boundary (GB) and protrusion of excimer laser annealed (ELA) low-temperature polycrystalline (LTPS) silicon thin-film transistors (TFTs).",

keywords = "Grain boundary protrusion, LTPS TFT, Self-heating, Technology computer-aided design (TCAD)",

author = "Siddik, {Abu Bakar} and Rabbi, {Md Hasnat} and Sangyeon Bae and Billah, {Mohammad Masum} and Jin Jang",

note = "Publisher Copyright: {\textcopyright} 2019 ITE and SID.; 26th International Display Workshops, IDW 2019 ; Conference date: 27-11-2019 Through 29-11-2019",

year = "2019",

language = "English",

series = "Proceedings of the International Display Workshops",

publisher = "International Display Workshops",

pages = "581--583",

booktitle = "26th International Display Workshops, IDW 2019",

}

Siddik, AB, Rabbi, MH, Bae, S, Billah, MM & Jang, J 2019, Self-heating effect of low-temperature polycrystalline silicon thin film transistor considering grain boundary protrusion. in 26th International Display Workshops, IDW 2019. Proceedings of the International Display Workshops, vol. 2, International Display Workshops, pp. 581-583, 26th International Display Workshops, IDW 2019, Sapporo, Japan, 27/11/19.

Self-heating effect of low-temperature polycrystalline silicon thin film transistor considering grain boundary protrusion. / Siddik, Abu Bakar; Rabbi, Md Hasnat; Bae, Sangyeon et al.
26th International Display Workshops, IDW 2019. International Display Workshops, 2019. p. 581-583 (Proceedings of the International Display Workshops; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Self-heating effect of low-temperature polycrystalline silicon thin film transistor considering grain boundary protrusion

AU - Siddik, Abu Bakar

AU - Rabbi, Md Hasnat

AU - Bae, Sangyeon

AU - Billah, Mohammad Masum

AU - Jang, Jin

PY - 2019

Y1 - 2019

N2 - A proper estimation of the self-heating effect is crucial to ensure the reliable performance of high mobility transistors. We perform Silvaco TCAD based thermal distribution modeling in grain, grain boundary (GB) and protrusion of excimer laser annealed (ELA) low-temperature polycrystalline (LTPS) silicon thin-film transistors (TFTs).

AB - A proper estimation of the self-heating effect is crucial to ensure the reliable performance of high mobility transistors. We perform Silvaco TCAD based thermal distribution modeling in grain, grain boundary (GB) and protrusion of excimer laser annealed (ELA) low-temperature polycrystalline (LTPS) silicon thin-film transistors (TFTs).

KW - Grain boundary protrusion

KW - LTPS TFT

KW - Self-heating

KW - Technology computer-aided design (TCAD)

UR - http://www.scopus.com/inward/record.url?scp=85105310515&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85105310515

T3 - Proceedings of the International Display Workshops

SP - 581

EP - 583

BT - 26th International Display Workshops, IDW 2019

PB - International Display Workshops

T2 - 26th International Display Workshops, IDW 2019

Y2 - 27 November 2019 through 29 November 2019

ER -

Self-heating effect of low-temperature polycrystalline silicon thin film transistor considering grain boundary protrusion

Abstract

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Bibliographical note

Keywords

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