Abstract
In-plane polarity of [11̄00]-oriented GaN domains coalesced from twins grown on a SiO2-patterned m-plane sapphire substrate was observed to be self-regulated in such a way that basal faces of coalesced domains were mainly found to have the (0001̄) polarity only. This self-regulation behavior of in-plane polarity was explained by a computational simulation of plan-view surface morphology evolution during coalescence of twins. Based on a computational simulation, asymmetrically suppressed growth rates of twins near a SiO2 pattern were proposed to be responsible for the survival of the slower growing (0001̄) basal faces instead of the faster growing (0001) basal faces during coalescence of twins.
Original language | English |
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Article number | 182105 |
Journal | Applied Physics Letters |
Volume | 104 |
Issue number | 18 |
DOIs | |
Publication status | Published - 5 May 2014 |