Size dependence of Si 2p core-level shift at Si nanocrystal/ Si O2 interfaces

Sung Kim; Min Choul Kim; Suk Ho Choi; Kyung Joong Kim; Han Na Hwang; Chan Cook Hwang

doi:10.1063/1.2776014

Size dependence of Si 2p core-level shift at Si nanocrystal/ Si O2 interfaces

Sung Kim, Min Choul Kim, Suk Ho Choi, Kyung Joong Kim, Han Na Hwang, Chan Cook Hwang

Research output: Contribution to journal › Article › peer-review

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Abstract

Synchrotron-radiation x-ray photoelectron spectroscopy (XPS) has been used to analyze size-dependent Si 2p core-level spectra of Si nanocrystals (NCs) embedded in Si O2. The Si0 and suboxide XPS peaks of Si NCs shift to higher binding energies with decreasing NC size, which is based on the resolved spectra fitted by using Gaussian-Lorentzian lines for the Si oxidation states. It is also found that the shell region around Si NC bordered by Si O2 consists of the three Si suboxide states, Si1+, Si2+, and Si3+, whose densities are also strongly dependent on NC size. These results suggest that the analysis of the Si 2p core-level shift by XPS is useful for characterizing the size effect of Si NC at the Si NCSi O2 interfaces.

Original language	English
Article number	103113
Journal	Applied Physics Letters
Volume	91
Issue number	10
DOIs	https://doi.org/10.1063/1.2776014
Publication status	Published - 2007

Bibliographical note

Funding Information:
This work was supported by the National Research Program for the 0.1 Terabit Non-Volatile Memory Development sponsored by Korea Ministry of Science and Technology and was performed using the high-voltage electron microscope ( 1.25 MV , JEM-ARM1300S, JEOL, Japan) installed at Korea Basic Science Institute.

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title = "Size dependence of Si 2p core-level shift at Si nanocrystal/ Si O2 interfaces",

abstract = "Synchrotron-radiation x-ray photoelectron spectroscopy (XPS) has been used to analyze size-dependent Si 2p core-level spectra of Si nanocrystals (NCs) embedded in Si O2. The Si0 and suboxide XPS peaks of Si NCs shift to higher binding energies with decreasing NC size, which is based on the resolved spectra fitted by using Gaussian-Lorentzian lines for the Si oxidation states. It is also found that the shell region around Si NC bordered by Si O2 consists of the three Si suboxide states, Si1+, Si2+, and Si3+, whose densities are also strongly dependent on NC size. These results suggest that the analysis of the Si 2p core-level shift by XPS is useful for characterizing the size effect of Si NC at the Si NCSi O2 interfaces.",

author = "Sung Kim and Kim, {Min Choul} and Choi, {Suk Ho} and Kim, {Kyung Joong} and Hwang, {Han Na} and Hwang, {Chan Cook}",

note = "Funding Information: This work was supported by the National Research Program for the 0.1 Terabit Non-Volatile Memory Development sponsored by Korea Ministry of Science and Technology and was performed using the high-voltage electron microscope ( 1.25 MV , JEM-ARM1300S, JEOL, Japan) installed at Korea Basic Science Institute. ",

year = "2007",

doi = "10.1063/1.2776014",

language = "English",

volume = "91",

journal = "Applied Physics Letters",

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T1 - Size dependence of Si 2p core-level shift at Si nanocrystal/ Si O2 interfaces

AU - Kim, Sung

AU - Kim, Min Choul

AU - Choi, Suk Ho

AU - Kim, Kyung Joong

AU - Hwang, Han Na

AU - Hwang, Chan Cook

N1 - Funding Information: This work was supported by the National Research Program for the 0.1 Terabit Non-Volatile Memory Development sponsored by Korea Ministry of Science and Technology and was performed using the high-voltage electron microscope ( 1.25 MV , JEM-ARM1300S, JEOL, Japan) installed at Korea Basic Science Institute.

PY - 2007

Y1 - 2007

N2 - Synchrotron-radiation x-ray photoelectron spectroscopy (XPS) has been used to analyze size-dependent Si 2p core-level spectra of Si nanocrystals (NCs) embedded in Si O2. The Si0 and suboxide XPS peaks of Si NCs shift to higher binding energies with decreasing NC size, which is based on the resolved spectra fitted by using Gaussian-Lorentzian lines for the Si oxidation states. It is also found that the shell region around Si NC bordered by Si O2 consists of the three Si suboxide states, Si1+, Si2+, and Si3+, whose densities are also strongly dependent on NC size. These results suggest that the analysis of the Si 2p core-level shift by XPS is useful for characterizing the size effect of Si NC at the Si NCSi O2 interfaces.

AB - Synchrotron-radiation x-ray photoelectron spectroscopy (XPS) has been used to analyze size-dependent Si 2p core-level spectra of Si nanocrystals (NCs) embedded in Si O2. The Si0 and suboxide XPS peaks of Si NCs shift to higher binding energies with decreasing NC size, which is based on the resolved spectra fitted by using Gaussian-Lorentzian lines for the Si oxidation states. It is also found that the shell region around Si NC bordered by Si O2 consists of the three Si suboxide states, Si1+, Si2+, and Si3+, whose densities are also strongly dependent on NC size. These results suggest that the analysis of the Si 2p core-level shift by XPS is useful for characterizing the size effect of Si NC at the Si NCSi O2 interfaces.

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DO - 10.1063/1.2776014

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VL - 91

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 10

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ER -

Size dependence of Si 2p core-level shift at Si nanocrystal/ Si O2 interfaces

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