Spectroscopic ellipsometric study of the dielectric function of ZnSe and its overlayer

T. J. Kim; M. S. Koo; M. S. Lee; Y. D. Kim; D. E. Aspnes; B. T. Jonker

Spectroscopic ellipsometric study of the dielectric function of ZnSe and its overlayer

T. J. Kim
, M. S. Koo
, M. S. Lee
, Y. D. Kim
, D. E. Aspnes
, B. T. Jonker

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

Using our best room-temperature < ε > spectrum as a representation of the true bulk dielectric function e of ZnSe, we determine the dielectric properties of the natural overlayer on ZnSe by following the evolution of < ε > with chemical processing. This overlayer has the optical properties of a Bruggeman effective-medium mixture of a-(amorphous-) Se, GaAsO₃, and voids, showing that previous assumptions about the optical properties of the overlayer and its thickness are incorrect.

Original language	English
Pages (from-to)	S372-S375
Journal	Journal of the Korean Physical Society
Volume	39
Issue number	SUPPL. Part 1
Publication status	Published - Dec 2001

Cite this

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title = "Spectroscopic ellipsometric study of the dielectric function of ZnSe and its overlayer",

abstract = "Using our best room-temperature < ε > spectrum as a representation of the true bulk dielectric function e of ZnSe, we determine the dielectric properties of the natural overlayer on ZnSe by following the evolution of < ε > with chemical processing. This overlayer has the optical properties of a Bruggeman effective-medium mixture of a-(amorphous-) Se, GaAsO3, and voids, showing that previous assumptions about the optical properties of the overlayer and its thickness are incorrect.",

author = "Kim, \{T. J.\} and Koo, \{M. S.\} and Lee, \{M. S.\} and Kim, \{Y. D.\} and Aspnes, \{D. E.\} and Jonker, \{B. T.\}",

year = "2001",

month = dec,

language = "English",

volume = "39",

pages = "S372--S375",

journal = "Journal of the Korean Physical Society",

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publisher = "Korean Physical Society",

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T1 - Spectroscopic ellipsometric study of the dielectric function of ZnSe and its overlayer

AU - Kim, T. J.

AU - Koo, M. S.

AU - Lee, M. S.

AU - Kim, Y. D.

AU - Aspnes, D. E.

AU - Jonker, B. T.

PY - 2001/12

Y1 - 2001/12

N2 - Using our best room-temperature < ε > spectrum as a representation of the true bulk dielectric function e of ZnSe, we determine the dielectric properties of the natural overlayer on ZnSe by following the evolution of < ε > with chemical processing. This overlayer has the optical properties of a Bruggeman effective-medium mixture of a-(amorphous-) Se, GaAsO3, and voids, showing that previous assumptions about the optical properties of the overlayer and its thickness are incorrect.

AB - Using our best room-temperature < ε > spectrum as a representation of the true bulk dielectric function e of ZnSe, we determine the dielectric properties of the natural overlayer on ZnSe by following the evolution of < ε > with chemical processing. This overlayer has the optical properties of a Bruggeman effective-medium mixture of a-(amorphous-) Se, GaAsO3, and voids, showing that previous assumptions about the optical properties of the overlayer and its thickness are incorrect.

UR - https://www.scopus.com/pages/publications/0035542136

M3 - Article

AN - SCOPUS:0035542136

SN - 0374-4884

VL - 39

SP - S372-S375

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - SUPPL. Part 1

ER -

Spectroscopic ellipsometric study of the dielectric function of ZnSe and its overlayer

Abstract

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