Spin domain mapping of a CrO2 thin film using spin-polarized current microscopy

J. Y. Son; C. H. Kim; J. H. Cho; Y. S. Shin; Y. H. Shin

doi:10.1016/j.ssc.2011.04.022

Spin domain mapping of a CrO₂ thin film using spin-polarized current microscopy

J. Y. Son
, C. H. Kim
, J. H. Cho
, Y. S. Shin
, Y. H. Shin

Research output: Contribution to journal › Article › peer-review

Abstract

We investigate spin domain mapping of a CrO₂ thin film using spin-polarized current microscopy at room temperature, where conductive atomic force microscopy (CAFM) with a CrO₂-coated tip is used. The nanoscale spin domains of the CrO₂ thin film were crosschecked by magnetic force microscopy (MFM). Notably, the CAFM exhibits the spin domains of the CrO₂ thin film with higher resolution than the MFM, which may result from a local point contact between the nanoscale CrO₂-coated tip and surface of the CrO₂ thin film.

Original language	English
Pages (from-to)	1192-1195
Number of pages	4
Journal	Solid State Communications
Volume	151
Issue number	17
DOIs	https://doi.org/10.1016/j.ssc.2011.04.022
Publication status	Published - Sept 2011

Bibliographical note

Funding Information:
This work has been supported by Priority Research Center Program through NRF funded by the Ministry of Education, Science and Technology ( 2009-0093818 ) and a fund from National Research Foundation of Korea Grant (No. 2010-0021536 ).

Keywords

A. Magnetic films and multilayers
B. Chemical synthesis
D. Tunneling

Access to Document

10.1016/j.ssc.2011.04.022

Cite this

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title = "Spin domain mapping of a CrO2 thin film using spin-polarized current microscopy",

abstract = "We investigate spin domain mapping of a CrO2 thin film using spin-polarized current microscopy at room temperature, where conductive atomic force microscopy (CAFM) with a CrO2-coated tip is used. The nanoscale spin domains of the CrO2 thin film were crosschecked by magnetic force microscopy (MFM). Notably, the CAFM exhibits the spin domains of the CrO2 thin film with higher resolution than the MFM, which may result from a local point contact between the nanoscale CrO2-coated tip and surface of the CrO2 thin film.",

keywords = "A. Magnetic films and multilayers, B. Chemical synthesis, D. Tunneling",

author = "Son, \{J. Y.\} and Kim, \{C. H.\} and Cho, \{J. H.\} and Shin, \{Y. S.\} and Shin, \{Y. H.\}",

note = "Funding Information: This work has been supported by Priority Research Center Program through NRF funded by the Ministry of Education, Science and Technology ( 2009-0093818 ) and a fund from National Research Foundation of Korea Grant (No. 2010-0021536 ).",

year = "2011",

month = sep,

doi = "10.1016/j.ssc.2011.04.022",

language = "English",

volume = "151",

pages = "1192--1195",

journal = "Solid State Communications",

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AU - Son, J. Y.

AU - Kim, C. H.

AU - Cho, J. H.

AU - Shin, Y. S.

AU - Shin, Y. H.

N1 - Funding Information: This work has been supported by Priority Research Center Program through NRF funded by the Ministry of Education, Science and Technology ( 2009-0093818 ) and a fund from National Research Foundation of Korea Grant (No. 2010-0021536 ).

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N2 - We investigate spin domain mapping of a CrO2 thin film using spin-polarized current microscopy at room temperature, where conductive atomic force microscopy (CAFM) with a CrO2-coated tip is used. The nanoscale spin domains of the CrO2 thin film were crosschecked by magnetic force microscopy (MFM). Notably, the CAFM exhibits the spin domains of the CrO2 thin film with higher resolution than the MFM, which may result from a local point contact between the nanoscale CrO2-coated tip and surface of the CrO2 thin film.

AB - We investigate spin domain mapping of a CrO2 thin film using spin-polarized current microscopy at room temperature, where conductive atomic force microscopy (CAFM) with a CrO2-coated tip is used. The nanoscale spin domains of the CrO2 thin film were crosschecked by magnetic force microscopy (MFM). Notably, the CAFM exhibits the spin domains of the CrO2 thin film with higher resolution than the MFM, which may result from a local point contact between the nanoscale CrO2-coated tip and surface of the CrO2 thin film.

KW - A. Magnetic films and multilayers

KW - B. Chemical synthesis

KW - D. Tunneling

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