@inproceedings{759f2849c0fd43b8aa20c28b2cc9b1ca,
title = "Stability of UV exposed RR-P3BT films by spectroscopic ellipsometry",
abstract = "Stability of regioregular poly(3-butylthiophene) (RR-P3BT) films under irradiation of ultra-violet (UV) light has been studied by spectroscopic ellipsometry at room temperature. Consistent decrease in dielectric function with UV exposure time showed the degree of degradation of polymer. This work suggests that, protective methods are mandatory to use this kind of material in optical devices.",
keywords = "Ellipsometry, Optical property, P3BT, Photodegradation",
author = "Diware, {Mangesh S.} and Byun, {J. S.} and Hwang, {S. Y.} and Kim, {T. J.} and Kim, {Y. D.}",
note = "Copyright: Copyright 2013 Elsevier B.V., All rights reserved.; 57th DAE Solid State Physics Symposium 2012 ; Conference date: 03-12-2012 Through 07-12-2012",
year = "2013",
doi = "10.1063/1.4791209",
language = "English",
isbn = "9780735411333",
series = "AIP Conference Proceedings",
pages = "658--659",
booktitle = "Solid State Physics - Proceedings of the 57th DAE Solid State Physics Symposium 2012",
}