Study on device stability of green PHOLEDs with ultrathin interface tunneling layer

So Ra Park; Ja Yeon Lee; Min Chul Suh

Study on device stability of green PHOLEDs with ultrathin interface tunneling layer

So Ra Park, Ja Yeon Lee, Min Chul Suh

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We have focused on interface modification of green phosphorescent organic light-emitting diodes. In other words, we inserted unique interface tunneling layer (ITL) at both sides of emitting layers (EML) to improve the injection behavior which minimizes a charge accumulation at EML interfaces. Consequently, we obtained a significantly improved device lifetime.

Original language	English
Title of host publication	25th International Display Workshops, IDW 2018
Publisher	International Display Workshops
Pages	716-717
Number of pages	2
ISBN (Electronic)	9781510883918
Publication status	Published - 2018
Event	25th International Display Workshops, IDW 2018 - Nagoya, Japan Duration: 12 Dec 2018 → 14 Dec 2018

Publication series

Name	Proceedings of the International Display Workshops
Volume	2
ISSN (Print)	1883-2490

Conference

Conference	25th International Display Workshops, IDW 2018
Country/Territory	Japan
City	Nagoya
Period	12/12/18 → 14/12/18

Bibliographical note

Publisher Copyright:
© 2018 International Display Workshops. All rights reserved.

Keywords

Device stability
Improved device lifetime
Interface engineering
Organic light-emitting diodes
Tunneling injection

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

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title = "Study on device stability of green PHOLEDs with ultrathin interface tunneling layer",

abstract = "We have focused on interface modification of green phosphorescent organic light-emitting diodes. In other words, we inserted unique interface tunneling layer (ITL) at both sides of emitting layers (EML) to improve the injection behavior which minimizes a charge accumulation at EML interfaces. Consequently, we obtained a significantly improved device lifetime.",

keywords = "Device stability, Improved device lifetime, Interface engineering, Organic light-emitting diodes, Tunneling injection",

author = "Park, {So Ra} and Lee, {Ja Yeon} and Suh, {Min Chul}",

note = "Publisher Copyright: {\textcopyright} 2018 International Display Workshops. All rights reserved.; 25th International Display Workshops, IDW 2018 ; Conference date: 12-12-2018 Through 14-12-2018",

year = "2018",

language = "English",

series = "Proceedings of the International Display Workshops",

publisher = "International Display Workshops",

pages = "716--717",

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Study on device stability of green PHOLEDs with ultrathin interface tunneling layer. / Park, So Ra; Lee, Ja Yeon; Suh, Min Chul.
25th International Display Workshops, IDW 2018. International Display Workshops, 2018. p. 716-717 (Proceedings of the International Display Workshops; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Lee, Ja Yeon

AU - Suh, Min Chul

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AB - We have focused on interface modification of green phosphorescent organic light-emitting diodes. In other words, we inserted unique interface tunneling layer (ITL) at both sides of emitting layers (EML) to improve the injection behavior which minimizes a charge accumulation at EML interfaces. Consequently, we obtained a significantly improved device lifetime.

KW - Device stability

KW - Improved device lifetime

KW - Interface engineering

KW - Organic light-emitting diodes

KW - Tunneling injection

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ER -

Study on device stability of green PHOLEDs with ultrathin interface tunneling layer

Abstract

Publication series

Conference

Bibliographical note

Keywords

UN SDGs

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Cite this