Abstract
To synthesize an antistatic material for use in semiconductor wafer transport trays, in-situ polymerization of poly(methyl methacrylate) (PMMA) and polyurethane (PU) incorporating carbon nanotubes was designed and conducted. The newly synthesized composites were evaluated for their thermal and electrical conductivity properties under conditions mimicking commercial device manufacturing processes. Comparative analysis of their respective performances revealed that both PMMA and PU containing carbon nanotubes exhibited enhanced thermal properties and superior electrical conductivity as the nanotube content increased. Morphology of the composites synthesized via in-situ polymerization was confirmed to be excellent through FE-SEM analysis, demonstrating good dispersibility. Both PMMA and PU incorporating carbon nanotubes showed outstanding surface resistance values of 103 Ω/□, indicating their suitability as antistatic materials for semiconductor applications.
Original language | English |
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Pages (from-to) | 260-265 |
Number of pages | 6 |
Journal | Applied Chemistry for Engineering |
Volume | 35 |
Issue number | 3 |
DOIs | |
Publication status | Published - Jun 2024 |
Bibliographical note
Publisher Copyright:© 2024, Korean Society of Industrial Engineering Chemistry. All rights reserved.
Keywords
- Carbon nanotube
- Electrical conductivity
- In-situ polymerization
- Polyurethane
- Semiconductor