Temperature dependence of the dielectric function and critical points of monolayer WSe2

Xuan Au Nguyen, Long V. Le, Suk Hyun Kim, Young Duck Kim, Mangesh S. Diware, Tae Jung Kim, Young Dong Kim

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Monolayer materials typically display intriguing temperature-dependent dielectric and optical properties, which are crucial for improving the structure and functionality of associated devices. Due to its unique photoelectric capabilities, monolayer WSe2 has recently received a lot of attention in the fields of atomically thin electronics and optoelectronics. In this work, we focus on the evolution of the temperature-dependent dielectric function (ε = ε1 + i ε2) of monolayer WSe2 over energies from 0.74 to 6.40 eV and temperatures from 40 to 350 K. We analyze the second derivatives of ε with respect to energy to accurately locate the critical points (CP). The dependence of the observed CP energies on temperature is consistent with the alternative domination of the declining exciton binding energy as the temperature increases.

Original languageEnglish
Article number13486
JournalScientific Reports
Volume14
Issue number1
DOIs
Publication statusPublished - Dec 2024

Bibliographical note

Publisher Copyright:
© The Author(s) 2024.

Keywords

  • 2D-TMDC
  • Ellipsometry
  • Monolayer WSe
  • Temperature dependence

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