Temperature-dependent dielectric functions of InP between 25 K and 700 K

T. J. Kim, J. J. Yoon, Y. H. Cha, S. Kim, Y. D. Kim

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4 Citations (Scopus)

Abstract

We report the dielectric functions of InP at temperatures between 25 K and 700 K measured by using spectroscopic ellipsometry (SE) in the energy range from 1.19 to 6.57 eV. A blue shift and a separation of critical point (CP) structures were observed at low temperatures, which is explained by the reduced electron-phonon interaction and by the thermal expansion. The values of the CP energies were determined from numerically-calculated second energy derivatives of the data. Separation of the E2 CP structures (4 - 6.5 eV), which could not be detected at room temperature, was clearly shown at low temperatures. We report the temperature dependences of the E2' and the E1' CP energies, which have not been observed so far by using SE.

Original languageEnglish
Pages (from-to)1960-1964
Number of pages5
JournalJournal of the Korean Physical Society
Volume57
Issue number61
DOIs
Publication statusPublished - Dec 2010

Keywords

  • Critical point
  • Dielectric function
  • Ellipsometry
  • Temperature dependence

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