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Temperature-dependent optical properties of epitaxial CdO thin films determined by spectroscopic ellipsometry and Raman scattering

  • S. G. Choi
  • , L. M. Gedvilas
  • , S. Y. Hwang
  • , T. J. Kim
  • , Y. D. Kim
  • , J. Zúñiga-Pérez
  • , V. Muñoz Sanjosé

Research output: Contribution to journalArticlepeer-review

20 Citations (Scopus)

Abstract

We report temperature-dependent optical properties of epitaxial CdO thin films grown by metal-organic vapor phase epitaxy on sapphire substrates. Dielectric function 1 i2 spectra for CdO were extracted from the multilayer modeling of ellipsometric data, using a set of Tauc-Lorentz oscillators from 0.74 to 6.43 eV in the temperature range between 24 and 650 K. Temperature dependence of the energy for the major optical structures in the spectra was analyzed by using Varshnis approximation. Raman scattering (RS) spectroscopy was used to characterize the vibrational properties of CdO from 77 to 500 K. Several RS peaks were observed in the wavenumber range from 100 to 1000 cm-1. Peak positions, accurately determined by a series of Gaussian-Lorentzian mixed line profiles, exhibit a weak linear dependence on temperature.

Original languageEnglish
Article number183515
JournalJournal of Applied Physics
Volume113
Issue number18
DOIs
Publication statusPublished - 14 May 2013

Bibliographical note

Funding Information:
This work was supported by the U.S. Department of Energy under Contract No. DE-AC36-08-GO28308. The work done at Kyung Hee University was supported by WCU program (Grant No. R33-2012-000-10118-0) and NRF program (Grant No. 2012-0004085) funded by the MEST. The work done at the Universitat de València was supported by the Spanish Government under the Project Nos. MAT2007-66129, and TEC2011-28076-C02-02, and Generalitat Valenciana under the projects Prometeo/2011-035 and ISIC/2012/008, Institute of Nanotechnologies for Clean Energies.

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