Temperature-dependent optical properties of epitaxial CdO thin films determined by spectroscopic ellipsometry and Raman scattering

Chemistry

• Ellipsometry 100%
• Raman Spectra 100%
• Sapphire 50%
• Dielectric Function 50%
• Organic Metal 50%
• Wavenumber 50%
• Gaussian Distribution 50%
• Multilayer 50%
• Vapor Phase Epitaxy 50%
• Raman Spectrometry 50%

Physics

• Thin Films 100%
• Ellipsometry 100%
• Raman Spectra 100%
• Gaussian Distribution 33%
• Temperature Dependence 33%
• Dielectric Material 33%
• Vapor Phase Epitaxy 33%

Material Science

• Thin Films 100%
• Oscillator 50%
• Vapor Phase Epitaxy 50%
• Sapphire 50%
• Dielectric Material 50%