Abstract
A bottom contact organic thin film transistor (OTFT) is fabricated with an organic double-layered gate insulator (GI) and pentacene. Poly(methyl methacrylate) (PMMA) and 2-mercapto 5-nitrobenzimidazole (MNB) layers are deposited on the gate insulator and source/drain gold (S/D, Au) electrode before depositing pentacene to investigate the device properties. The sequence of surface treatment significantly affects the device performance. The ultra-thin PMMA (less than 5 nm) was deposited on the organic gate insulator and S/D metal by the spin coating method, which caused no deterioration of the on-state current (Ion), although a bottom contact structure was exploited. The lack of increase in the contact resistance (Rc) may be due to the difference in wettability between PMMA/Au and PMMA/organic GI. As a result, the devices treated with PMMA → MNB showed much better Ion behavior than those fabricated with MNB → PMMA. We report on the difference in the physical and electrical performances associated with the surface treatment sequence.
Original language | English |
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Pages (from-to) | 1953-1957 |
Number of pages | 5 |
Journal | Synthetic Metals |
Volume | 161 |
Issue number | 17-18 |
DOIs | |
Publication status | Published - Sept 2011 |
Bibliographical note
Funding Information:Prof. J. S. Park acknowledges funding from the collaborative R&D program with technology advanced country “Development of materials and stacked device structure for next generation solar cells, 2010-advanced-B-105” by the Ministry of Knowledge and Economy . Prof. M. C. Suh gratefully acknowledges to Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (Grant No. NRF-2011-0006847).
Keywords
- Contact resistance
- MNB
- Organic thin film transistor (OTFT)
- PMMA
- Sequence of surface treatment
- Wettability